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J601_lec05

 J601_lec05

5th Year, Integrated Technical Education Cluster AlAmeeria‎
lec#5, Electronic Principals

Ahmad El-Banna

November 23, 2014
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  1. Lecture #5 FET Biasing & AC Analysis Instructor: Dr. Ahmad

    El-Banna November 2014 J-601-1448 Electronic Principals Integrated Technical Education Cluster At AlAmeeria‎ © Ahmad El-Banna
  2. Agenda 2 J-601-1448 , Lec#5 , Nov 2014 © Ahmad

    El-Banna Construction and Characteristics FET Biasing Design and Troubleshooting JFET small signal Model FET Amplifier Networks Practical Applications Note! Same concepts of the BJT, so we will just overview the FET transistors.
  3. Construction 4 J-601-1448 , Lec#5 , Nov 2014 © Ahmad

    El-Banna • One of the most important characteristics of the FET is its high input impedance. • FETs are more temperature stable than BJTs, and FETs are usually smaller than BJTs, making them particularly useful in integrated-circuit (IC) chips.
  4. Depletion-Type MOSFET 7 J-601-1448 , Lec#5 , Nov 2014 ©

    Ahmad El-Banna • There is no direct electrical connection between the gate terminal and the channel of a MOSFET. • It is the insulating layer of SiO2 in the MOSFET construction that accounts for the very desirable high input impedance of the device.
  5. Other MOSFETS 9 J-601-1448 , Lec#5 , Nov 2014 ©

    Ahmad El-Banna • VMOS AND UMOS POWER MOSFETs • CMOS • MESFET
  6. Troubleshooting 17 J-601-1448 , Lec#5 , Nov 2014 © Ahmad

    El-Banna The level of VDS is typically between 25% and 75% of VDD . The continuity of a network can be checked simply by measuring the voltage across any resistor of the network.
  7. Fixed-Bias Configuration 20 J-601-1448 , Lec#5 , Nov 2014 ©

    Ahmad El-Banna phase shift of 180° between input and output voltages.
  8. • For more details, refer to: • Chapter 6,7,8, Electronic

    Devices and Circuits, Boylestad. • The lecture is available online at: • https://speakerdeck.com/ahmad_elbanna • For inquires, send to: • [email protected] 30 J-601-1448 , Lec#5 , Nov 2014 © Ahmad El-Banna